在本論文中，為使商用光碟機雷射讀寫光源達到最佳的讀寫效率以及提高記錄點訊號讀寫的重複性，我們藉由雷射讀寫光源寫入方式的改變 (Radial Orientation Spot, ROS type)，在商用可複寫式光碟片DVD+RW溝軌中，寫下串列的相變化記錄點訊號。並利用導電式原子力顯微儀 (Conductive Atomic Force Microscope, C-AFM) 探測相變化記錄點的技術，探討不同雷射讀寫光源寫入方式對於相變化記錄點形貌改變的影響。
此外，在以氧化鋅 (ZnOx) 作為近場主動層的近場光碟膜層結構中，為得到最佳化的記錄點讀寫訊號，我們藉由氧化鋅近場光碟膜層結構的改變以及C-AFM量測相變化記錄點的技術，分析並探討氧化鋅近場主動層對於相變化記錄層Ge2Sb2Te5的作用，並藉由實驗結果得到膜層結構改變對於記錄點讀寫訊號的影響。

In this study, to get the optimized reading and writing efficiency of the pick-up head in commercial optical driver and promote the repetition of recording marks on phase-change material, we record and readout series of mark trains on commercial rewritable DVD disk (DVD+RW) with radial orientation spot (ROS type). For further studies, the technique of imaging phase-change recording marks with conductive atomic force microscope (C-AFM) is applied to investigate the relation between different writing strategy and the topographic change of recording marks.
Moreover, in the study of the near-field optical disk with zinc oxide (ZnOx) near-field active layer, we also optimize the layered structure of ZnOx-type near-field optical disk and investigate the recording marks with C-AFM. From the experimental results, the optical and thermal effect of ZnOx near-field active layer can be obtained and the readout signals of layered structure change are studied as well.

[1] 蔡定平, 光訊, 第七十四期, 十一頁 (1998).
[2] 蔡定平, 光訊, 第七十五期, 二十九頁 (1999).
[3]蔡定平, 林威志, 光訊, 第八十七期, 十四頁 (2001).
[4] 劉威志, 林威志, 蔡定平, 物理, 第二十三卷第二期, 三百三十五頁 (2001).
[5] 林威志, 蔡定平, 劉威志, 光學工程, 第七十八期, 二十頁 (2002).
[6] 鞠岱琦, 林威志, 自然科學簡訊, 第十四卷第四期, 一百六十七頁 (2002).
[7] 林威志, 蔡定平, 電子月刊, 第九十期, 一百六十七頁 (2003).
[8] 高宗聖, 蔡定平, 第三百八十六期, 二十二頁 (2005).
[9] M. Born, E. Wolf. Principles of Optics, Oxford. Pergamon, 81 (1959).
[10] E. Betzig, P. L. Finn and J. S. Weiner, Appl. Phys. Lett., 60, 2484 (1992).
[11] J. Tominoga, T. Nakano and N. Atoda, SPIE Proc., 3467, 282 (1998).
[12] D. P. Tsai, C. W. Yang, W. C. Lin, F. H. Ho, H. J. Huang, M. Y. Chen, T. F. Tseng, C. H. Lee, C. J. Yeh, Jpn. J. Appl. Phys., 39, 982 (2000).
[13] D. P. Tsai, W. C. Lin, Appl. Phys. Lett., 77, 1413 (2000).
[14] W. C. Liu, C. Y. Wen, K. H. Chen, W. C. Lin, D. P. Tsai, Appl. Phys. Lett., 78, 685 (2001).
[15] N. H. Lu, W. C. Lin, D. P. Tsai, Journal of Microscopy, 202, 172 (2001).
[16] T. Fukaya, D. Buechel, S. Shinbori, J. Tominaga, N. Atoda, D. P. Tsai, W. C. Lin, J. Appl. Phys., 89, 6139 (2001).
[17] Y . Guo, H. Ming, L Tang, Y. H. Lu, P. Wang, D. P. Tsai, W. C. Lin, Opt. Comm., 212, 7 (2002).
[18] Y. Guo, H. Ming, L. Tang, P. Wang, Y. H. Lu, C. S. Xiong, Y. H. Xiong, T. P. Zhao, D. P. Tsai, W. C. Lin, Optical, 113, 322 (2002).
[19] W. C. Lin, T. S. Kao, H. H. Chang, Y. H. Lin, Y. H. Fu, C. T. Wu, K. H. Chen, D. P. Tsai, Jpn. J. Appl. Phys., 42, 1029 (2003).
[20] Y. H. Fu, F. H. Ho, W. C. Lin, D. P. Tsai, J. Microscopy, 210, 225 (2003).
[21] K. P. Chiu, W. C. Lin, Y. H. Fu, D. P. Tsai, Jpn. J. Appl. Phys, 43, 4730 (2004).
[22] J. Tominaga, T. Nakano, and N. Atoda, Jpn. J. Appl. Phys., 37, 1852 (1998).
[23] J. Tominaga, H. Fuji, A. Sato, T. Nakano, T. Fukaya, and N. Atoda, Jpn. J. Appl. Phys., 37, L1323 (1998).
[24] J. Tominaga, T. Nakano, and N. Atoda, Appl. Phys. Lett., 73, 2078 (1998).
[25] K.Yamamoto, T. Kamata . Yoshida, K. Yae, T. Fukaya, F. Mizukami, and T. Ohta, Chem. Mater., 10, 1343 (1998).
[26] M. Yamamoto, G. Mori, H. Tajima, N. Takamori, A. Takahashi, Jpn. J. Appl. Phys., 43, 4959 (2004).
[27] Q. Liu, T. Fukaya, J. Tominaga, Y. Iwanabe, T. Shima, Jpn. J. Appl. Phys., 44, 5156 (2005).
[28] S. K. Lin, P. Yang, I. C. Lin, H. W. Hsu, D. P. Tsai, Jpn. J. Appl. Phys., 45, 1431 (2006).
[29] J. W. Fang, C. C. Wu, A. Liao, W. C. Lin, D. P. Tsai, Jpn. J. Appl. Phys., 45, 1383 (2006).
[30] S. K. Lin, I. C. Lin, D. P. Tsai, Optics Express, 14, 4452 (2006)