本研究利用加拿大SCINTREX公司1997年發展出來的ENVI地球物理探勘系統中之ENVI-VLF測勘儀，取得地下構造的參數，分析地下低導電性導體所引發的電性異常。本研究先在師大分部歐洲公園埋設一磚體模型，利用澳洲的發射塔台作為電磁波的源場，進行模擬測勘。所得的原始資料分成in-phase 和quadrature兩部份， 經過 Fraser 濾波處理以濾除地表雜訊所引起的異常，再將處理過的資料做2-D的等值圖分析，以瞭解地下構造異常體的分布位置，再由Karous和Hjelt 線性濾波逆推地下異常地質體的等效電流密度，經由等效電流密度的剖面推測異常體的深度。
由於低導電性(low-conductivity)的模型在未固結的雜亂回填土壤中產生許多淺部甚低頻電磁波的異常反應，所以必須經濾波平滑處理後模型的反應才顯現。實測案例中，測線的安排橫切過地層對比明顯的斷層帶，VLF電磁波探勘能清楚解析斷層帶所造成的異常，經由濾波處理後的擬似剖面圖更能確定斷層帶的地下分布。VLF的淺層地質構造測勘確有其快速簡便的優點，而適當的濾波處理更能提高此法定量解析的可信度。

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